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Koji ISHIGURO

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  • Hitachinaka-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Mass spectrometer
    • Patent number 9,281,169
    • Issue date Mar 8, 2016
    • Hitachi High-Technologies Corporation
    • Hidetoshi Morokuma
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sample preparation container
    • Patent number D748813
    • Issue date Feb 2, 2016
    • Hitachi High-Technologies Corporation
    • Koji Ishiguro
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Component analyzer
    • Patent number D746476
    • Issue date Dec 29, 2015
    • Hitachi High-Technologies Corporation
    • Hiroyuki Noda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Mass spectrometer
    • Patent number 9,006,679
    • Issue date Apr 14, 2015
    • Hitachi High-Technologies Corporation
    • Hidetoshi Morokuma
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sample holder for a component analyzer
    • Patent number D711011
    • Issue date Aug 12, 2014
    • Hitachi High-Technologies Corporation
    • Hiroyuki Noda
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Ion source, ion beam processing/observation apparatus, charged part...
    • Patent number 8,779,400
    • Issue date Jul 15, 2014
    • Hitachi High-Technologies Corporation
    • Hiroyasu Shichi
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,664,588
    • Issue date Mar 4, 2014
    • Hitachi High-Technologies Corporation
    • Hiroyuki Noda
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Ion source, ion beam processing/observation apparatus, charged part...
    • Patent number 8,481,980
    • Issue date Jul 9, 2013
    • Hitachi High-Technologies Corporation
    • Hiroyasu Shichi
    • C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
  • Information Patent Grant

    Dual beam apparatus with tilting sample stage
    • Patent number 8,431,891
    • Issue date Apr 30, 2013
    • Hitachi High-Technologies Corporation
    • Hiroyasu Shichi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charge particle beam system, sample processing method, and semicond...
    • Patent number 7,777,183
    • Issue date Aug 17, 2010
    • Hitachi High-Technologies Corporation
    • Noriyuki Kaneoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ion beam processing apparatus
    • Patent number 7,700,931
    • Issue date Apr 20, 2010
    • Hitachi High-Tchnologies Corporation
    • Hiroyasu Shichi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Apparatus for ion beam fabrication
    • Patent number 7,696,496
    • Issue date Apr 13, 2010
    • Hitachi High-Technologies Corporation
    • Satoshi Tomimatsu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Manufacturing equipment using ION beam or electron beam
    • Patent number 7,592,606
    • Issue date Sep 22, 2009
    • Hitachi High-Technologies Corporation
    • Koji Ishiguro
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents