Koji Isodono

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Kashiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Logic circuit test apparatus and logic circuit test method
- Patent number 7,043,675
- Issue date May 9, 2006
- Sharp Kabushiki Kaisha
- Koji Isodono
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device having connection pads for...
- Patent number 6,886,076
- Issue date Apr 26, 2005
- Sharp Kabushiki Kaisha
- Koji Isodono
- G11 - INFORMATION STORAGE
Information Patent Grant
Tester and testing method for differential data drivers
- Patent number 6,724,182
- Issue date Apr 20, 2004
- Sharp Kabushiki Kaisha
- Koji Isodono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Logic circuit test apparatus and logic circuit test method
- Publication number 20040093542
- Publication date May 13, 2004
- Sharp Kabushiki Kaisha
- Koji Isodono
- G01 - MEASURING TESTING
Information Patent Application
Tester and testing method for differential data drivers
- Publication number 20020180414
- Publication date Dec 5, 2002
- Koji Isodono
- G01 - MEASURING TESTING