Koji Iwasaki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Focused charged beam apparatus, and its processing and observation...
- Patent number 5,525,806
- Issue date Jun 11, 1996
- Seiko Instruments Inc.
- Koji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus having charged particle energy filter
- Patent number 4,983,830
- Issue date Jan 8, 1991
- Seiko Instruments Inc.
- Koji Iwasaki
- G01 - MEASURING TESTING