Koji Kamei

Person

Ichihara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
SiC epitaxial wafer and method for manufacturing same
- Patent number 11,705,329
- Issue date Jul 18, 2023
- Showa Denko K.K.
- Koji Kamei
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
SiC epitaxial wafer containing large pit defects with a surface den...
- Patent number 11,320,388
- Issue date May 3, 2022
- Showa Denko K.K.
- Ling Guo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for producing a SiC epitaxial wafer containing a total densi...
- Patent number 11,293,115
- Issue date Apr 5, 2022
- Showa Denko K.K.
- Ling Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SiC substrate evaluation method and method for manufacturing SiC ep...
- Patent number 11,249,027
- Issue date Feb 15, 2022
- Showa Denko K.K.
- Yoshitaka Nishihara
- G01 - MEASURING TESTING
Information Patent Grant
SiC substrate, SiC epitaxial wafer, and method of manufacturing the...
- Patent number 10,985,042
- Issue date Apr 20, 2021
- Showa Denko K.K.
- Yoshitaka Nishihara
- C30 - CRYSTAL GROWTH
Information Patent Grant
SiC wafer defect measuring method, reference sample, and method of...
- Patent number 10,955,350
- Issue date Mar 23, 2021
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SiC epitaxial wafer and method for manufacturing SiC epitaxial wafer
- Patent number 10,865,500
- Issue date Dec 15, 2020
- Showa Denko K.K.
- Jun Norimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SiC substrate evaluation method and method for manufacturing SiC ep...
- Patent number 10,697,898
- Issue date Jun 30, 2020
- Showa Denko K.K.
- Yoshitaka Nishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Group III nitride semiconductor light-emitting device
- Patent number 8,866,186
- Issue date Oct 21, 2014
- Toyoda Gosei Co., Ltd.
- Gaku Oriji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor light emission element
- Patent number 8,829,555
- Issue date Sep 9, 2014
- Toyoda Gosei Co., Ltd.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor light emitting element and method for manufacturing s...
- Patent number 8,748,903
- Issue date Jun 10, 2014
- Toyoda Gosei Co., Ltd.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gallium nitride-based compound semiconductor light-emitting device...
- Patent number 8,093,605
- Issue date Jan 10, 2012
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gallium nitride-based compound semiconductor light emitting device
- Patent number 8,049,243
- Issue date Nov 1, 2011
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gallium nitride-based compound semiconductor light-emitting device
- Patent number 7,952,116
- Issue date May 31, 2011
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transparent positive electrode
- Patent number 7,875,896
- Issue date Jan 25, 2011
- Showa Denko K.K.
- Munetaka Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gallium nitride-based compound semiconductor light-emitting device
- Patent number 7,759,690
- Issue date Jul 20, 2010
- Showa Denko K.K.
- Hisayuki Miki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gallium nitride-based compound semiconductor light-emitting device
- Patent number 7,741,653
- Issue date Jun 22, 2010
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Positive electrode for compound semiconductor light-emitting device
- Patent number 7,544,974
- Issue date Jun 9, 2009
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gallium nitride-based compound semiconductor light-emitting device...
- Patent number 7,518,163
- Issue date Apr 14, 2009
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gallium nitride-based compound semiconductor light-emitting device...
- Patent number 7,452,740
- Issue date Nov 18, 2008
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SiC EPITAXIAL WAFER AND METHOD FOR MANUFACTURING SAME
- Publication number 20230268177
- Publication date Aug 24, 2023
- SHOWA DENKO K.K.
- Koji KAMEI
- C01 - INORGANIC CHEMISTRY
Information Patent Application
SiC EPITAXIAL WAFER, PRODUCTION METHOD THEREFOR, AND DEFECT IDENTIF...
- Publication number 20220259764
- Publication date Aug 18, 2022
- SHOWA DENKO K.K.
- Ling GUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIC SUBSTRATE EVALUATION METHOD AND METHOD FOR MANUFACTURING SIC EP...
- Publication number 20200284732
- Publication date Sep 10, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SiC EPITAXIAL WAFER AND METHOD FOR MANUFACTURING SAME
- Publication number 20200203163
- Publication date Jun 25, 2020
- SHOWA DENKO K.K.
- Koji KAMEI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SiC SUBSTRATE, SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE...
- Publication number 20200118854
- Publication date Apr 16, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- C30 - CRYSTAL GROWTH
Information Patent Application
SiC SUBSTRATE EVALUATION METHOD AND METHOD FOR MANUFACTURING SiC EP...
- Publication number 20200116649
- Publication date Apr 16, 2020
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- G01 - MEASURING TESTING
Information Patent Application
SiC WAFER DEFECT MEASURING METHOD, REFERENCE SAMPLE, AND METHOD OF...
- Publication number 20190331603
- Publication date Oct 31, 2019
- SHOWA DENKO K.K.
- Koji KAMEI
- G01 - MEASURING TESTING
Information Patent Application
SiC EPITAXIAL WAFER, PRODUCTION METHOD THEREFOR, LARGE PIT DEFECT D...
- Publication number 20190187068
- Publication date Jun 20, 2019
- SHOWA DENKO K.K.
- Ling GUO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SiC EPITAXIAL WAFER, PRODUCTION METHOD THEREFOR, AND DEFECT IDENTIF...
- Publication number 20190177876
- Publication date Jun 13, 2019
- SHOWA DENKO K.K.
- Ling GUO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER
- Publication number 20190172758
- Publication date Jun 6, 2019
- SHOWA DENKO K.K.
- Yoshitaka NISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIC EPITAXIAL WAFER AND METHOD FOR MANUFACTURING SIC EPITAXIAL WAFER
- Publication number 20180016706
- Publication date Jan 18, 2018
- SHOWA DENKO K.K.
- Jun NORIMATSU
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR LIGHT EMITTING ELEMENT AND METHOD FOR MANUFACTURING S...
- Publication number 20120217534
- Publication date Aug 30, 2012
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LIGHT EMISSION ELEMENT
- Publication number 20110316037
- Publication date Dec 29, 2011
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE
- Publication number 20100213501
- Publication date Aug 26, 2010
- SHOWA DENKO K.K.
- Koji KAMEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GROUP III NITRIDE SEMICONDUCTOR LIGHT-EMITTING DEVICE
- Publication number 20100181595
- Publication date Jul 22, 2010
- Showa Denko K.K.
- Gaku Oriji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE
- Publication number 20100102326
- Publication date Apr 29, 2010
- Showa Denko K.K.
- Koji KAMEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reflective Positive Electrode And Gallium Nitride-Based Compound Se...
- Publication number 20090263922
- Publication date Oct 22, 2009
- SHOWA DENKO K.K.
- Koji KAMEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE
- Publication number 20090224282
- Publication date Sep 10, 2009
- Showa Denko K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE
- Publication number 20090078951
- Publication date Mar 26, 2009
- Showa Denko K.K.
- Hisayuki Miki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gallium Nitride-Based Compound Semiconductor Light Emitting Device
- Publication number 20080315237
- Publication date Dec 25, 2008
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reflective Positive Electrode and Gallium Nitride-Based Compound Se...
- Publication number 20080283850
- Publication date Nov 20, 2008
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transparent Positive Electrode
- Publication number 20070200129
- Publication date Aug 30, 2007
- SHOWA DENKO K.K.
- Munetaka Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Positive electrode for compound semiconductor light-emitting device
- Publication number 20070181907
- Publication date Aug 9, 2007
- SHOWA DENKO K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gallium nitride-based compound semiconductor light-emitting device
- Publication number 20070170461
- Publication date Jul 26, 2007
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gallium nitride-based compound semiconductor light-emitting device...
- Publication number 20070108458
- Publication date May 17, 2007
- SHOWA DENKO K.K.
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gallium nitride-based compound semiconductor light-emitting device...
- Publication number 20070096126
- Publication date May 3, 2007
- Koji Kamei
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

SiC epitaxial wafer and method for manufacturing same

SiC epitaxial wafer containing large pit defects with a surface den...

Method for producing a SiC epitaxial wafer containing a total densi...

SiC substrate evaluation method and method for manufacturing SiC ep...

SiC substrate, SiC epitaxial wafer, and method of manufacturing the...

SiC wafer defect measuring method, reference sample, and method of...

SiC epitaxial wafer and method for manufacturing SiC epitaxial wafer

SiC substrate evaluation method and method for manufacturing SiC ep...

Group III nitride semiconductor light-emitting device

Semiconductor light emission element

Semiconductor light emitting element and method for manufacturing s...

Gallium nitride-based compound semiconductor light-emitting device...

Gallium nitride-based compound semiconductor light emitting device

Gallium nitride-based compound semiconductor light-emitting device

Transparent positive electrode

Gallium nitride-based compound semiconductor light-emitting device

Gallium nitride-based compound semiconductor light-emitting device

Positive electrode for compound semiconductor light-emitting device

Gallium nitride-based compound semiconductor light-emitting device...

Gallium nitride-based compound semiconductor light-emitting device...

Patents Applicationslast 30 patents

SiC EPITAXIAL WAFER AND METHOD FOR MANUFACTURING SAME

SiC EPITAXIAL WAFER, PRODUCTION METHOD THEREFOR, AND DEFECT IDENTIF...

SIC SUBSTRATE EVALUATION METHOD AND METHOD FOR MANUFACTURING SIC EP...

SiC EPITAXIAL WAFER AND METHOD FOR MANUFACTURING SAME

SiC SUBSTRATE, SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE...

SiC SUBSTRATE EVALUATION METHOD AND METHOD FOR MANUFACTURING SiC EP...

SiC WAFER DEFECT MEASURING METHOD, REFERENCE SAMPLE, AND METHOD OF...

SiC EPITAXIAL WAFER, PRODUCTION METHOD THEREFOR, LARGE PIT DEFECT D...

SiC EPITAXIAL WAFER, PRODUCTION METHOD THEREFOR, AND DEFECT IDENTIF...

EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER

SIC EPITAXIAL WAFER AND METHOD FOR MANUFACTURING SIC EPITAXIAL WAFER

SEMICONDUCTOR LIGHT EMITTING ELEMENT AND METHOD FOR MANUFACTURING S...

SEMICONDUCTOR LIGHT EMISSION ELEMENT

GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE

GROUP III NITRIDE SEMICONDUCTOR LIGHT-EMITTING DEVICE

GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE

Reflective Positive Electrode And Gallium Nitride-Based Compound Se...

GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE

GALLIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR LIGHT-EMITTING DEVICE

Gallium Nitride-Based Compound Semiconductor Light Emitting Device

Reflective Positive Electrode and Gallium Nitride-Based Compound Se...

Transparent Positive Electrode

Positive electrode for compound semiconductor light-emitting device

Gallium nitride-based compound semiconductor light-emitting device

Gallium nitride-based compound semiconductor light-emitting device...

Gallium nitride-based compound semiconductor light-emitting device...