Koji Kamoshida

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample inspection automation system and sample transfer method
- Patent number 9,952,239
- Issue date Apr 24, 2018
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection automation system
- Patent number 9,645,161
- Issue date May 9, 2017
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample pretreatment system that supports multisystem configuration
- Patent number 9,632,100
- Issue date Apr 25, 2017
- Hitachi High-Technologies Corporation
- Iwao Suzuki
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sample transport system and method for controlling the same
- Patent number 9,483,048
- Issue date Nov 1, 2016
- Hitachi High-Technologies Corporation
- Shigeru Yano
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automatic analysis system and device management server
- Patent number 9,466,040
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yoshiyuki Tajima
- G01 - MEASURING TESTING
Information Patent Grant
Sample-test-device management server, sample test device, sample te...
- Patent number 9,377,478
- Issue date Jun 28, 2016
- Hitachi High-Technologies Corporation
- Takashi Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Automated sample test system, and method for controlling same
- Patent number 8,972,044
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Atsushi Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE INSPECTION AUTOMATION SYSTEM AND SAMPLE TRANSFER METHOD
- Publication number 20150192598
- Publication date Jul 9, 2015
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRETREATMENT SYSTEM THAT SUPPORTS MULTISYSTEM CONFIGURATION
- Publication number 20140373642
- Publication date Dec 25, 2014
- Hitachi High-Technologies Corporation
- Iwao Suzuki
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION AUTOMATION SYSTEM
- Publication number 20140208872
- Publication date Jul 31, 2014
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TRANSPORT SYSTEM AND METHOD FOR CONTROLLING THE SAME
- Publication number 20130310964
- Publication date Nov 21, 2013
- Hitachi High-Technologies Corporation
- Shigeru Yano
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SAMPLE TEST SYSTEM, AND METHOD FOR CONTROLLING SAME
- Publication number 20130197690
- Publication date Aug 1, 2013
- Hitachi High-Technologies Corporation
- Atsushi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS SYSTEM AND DEVICE MANAGEMENT SERVER
- Publication number 20130117042
- Publication date May 9, 2013
- Hitachi High-Technologies Corporation
- Yoshiyuki Tajima
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZING DEVICE
- Publication number 20120239676
- Publication date Sep 20, 2012
- Hitachi High-Technologies Corporation
- Yasuo Kaneko
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE-TEST-DEVICE MANAGEMENT SERVER, SAMPLE TEST DEVICE, SAMPLE TE...
- Publication number 20120144009
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Takashi Noguchi
- G01 - MEASURING TESTING

Koji Kamoshida

Person

Patents Grantslast 30 patents

Sample inspection automation system and sample transfer method

Sample inspection automation system

Sample pretreatment system that supports multisystem configuration

Sample transport system and method for controlling the same

Automatic analysis system and device management server

Sample-test-device management server, sample test device, sample te...

Automated sample test system, and method for controlling same

Patents Applicationslast 30 patents

SAMPLE INSPECTION AUTOMATION SYSTEM AND SAMPLE TRANSFER METHOD

SAMPLE PRETREATMENT SYSTEM THAT SUPPORTS MULTISYSTEM CONFIGURATION

SAMPLE INSPECTION AUTOMATION SYSTEM

SAMPLE TRANSPORT SYSTEM AND METHOD FOR CONTROLLING THE SAME

AUTOMATED SAMPLE TEST SYSTEM, AND METHOD FOR CONTROLLING SAME

AUTOMATIC ANALYSIS SYSTEM AND DEVICE MANAGEMENT SERVER

AUTOMATIC ANALYZING DEVICE

SAMPLE-TEST-DEVICE MANAGEMENT SERVER, SAMPLE TEST DEVICE, SAMPLE TE...