Koji Okuno

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of measuring semiconductor device by applying voltage to the...
- Patent number 11,125,803
- Issue date Sep 21, 2021
- Mitsubishi Electric Corporation
- Koji Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 10,916,666
- Issue date Feb 9, 2021
- Mitsubishi Electric Corporation
- Koji Okuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 9,704,947
- Issue date Jul 11, 2017
- Mitsubishi Electric Corporation
- Kohei Ebihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device
- Patent number 9,324,806
- Issue date Apr 26, 2016
- Mitsubishi Electric Corporation
- Chihiro Tadokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing silicon carbide semiconductor device
- Patent number 8,258,052
- Issue date Sep 4, 2012
- Mitsubishi Electric Corporation
- Koji Okuno
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND PROGRAM FOR AUTOMATICALLY ARRANGING PARTS ON CAD
- Publication number 20230351066
- Publication date Nov 2, 2023
- Mitsubishi Electric Corporation
- Katsumi URYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING S...
- Publication number 20230034063
- Publication date Feb 2, 2023
- Mitsubishi Electric Corporation
- Koji OKUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200127144
- Publication date Apr 23, 2020
- Mitsubishi Electric Corporation
- Koji OKUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING SEMICONDUCTOR DEVICE
- Publication number 20190310306
- Publication date Oct 10, 2019
- Mitsubishi Electric Corporation
- Koji OKUNO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20160087031
- Publication date Mar 24, 2016
- MITSUBISHI ELECTRIC CORPORATION
- Kohei EBIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE
- Publication number 20150318357
- Publication date Nov 5, 2015
- Mitsubishi Electric Corporation
- Chihiro TADOKORO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE
- Publication number 20110195563
- Publication date Aug 11, 2011
- MITSUBISHI ELECTRIC CORPORATION
- Koji Okuno
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Method of measuring semiconductor device by applying voltage to the...

Semiconductor device

Semiconductor device and method for manufacturing same

Silicon carbide semiconductor device

Method of manufacturing silicon carbide semiconductor device

Patents Applicationslast 30 patents

METHOD AND PROGRAM FOR AUTOMATICALLY ARRANGING PARTS ON CAD

SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING S...

SEMICONDUCTOR DEVICE

METHOD OF MEASURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

SILICON CARBIDE SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE