Koji TAKAHASHI

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and recording medium
- Patent number 8,407,522
- Issue date Mar 26, 2013
- Advantest Corporation
- Koji Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Failure analyzer for semiconductor tester
- Patent number 5,610,925
- Issue date Mar 11, 1997
- Advantest Corporation
- Koji Takahashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS, TEST SIGNAL SUPPLY APPARATUS, TEST METHOD, AND COMP...
- Publication number 20170102429
- Publication date Apr 13, 2017
- Advantest Corporation
- Koji TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND RECORDING MEDIUM
- Publication number 20100169714
- Publication date Jul 1, 2010
- Advantest Corporation
- Koji TAKAHASHI
- G01 - MEASURING TESTING