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Koki Daikoku

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  • Kanagawa, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    L-mode guided wave sensor
    • Patent number 9,551,691
    • Issue date Jan 24, 2017
    • IHI Inspection and Instrumentation Co., Ltd.
    • Koki Daikoku
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing method using guided wave
    • Patent number 9,068,938
    • Issue date Jun 30, 2015
    • IHI Inspection and Instrumentation Co., Ltd.
    • Koki Daikoku
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing method using guided wave
    • Patent number 9,038,472
    • Issue date May 26, 2015
    • IHI Inspection and Instrumentation Co., Ltd.
    • Koki Daikoku
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    L-MODE GUIDED WAVE SENSOR
    • Publication number 20130036822
    • Publication date Feb 14, 2013
    • IHI INSPECTION & INSTRUMENTATION CO., LTD.
    • Koki Daikoku
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING METHOD USING GUIDED WAVE
    • Publication number 20120291552
    • Publication date Nov 22, 2012
    • IHI INSPECTION & INSTRUMENTATION CO., LTD.
    • Koki Daikoku
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING METHOD USING GUIDED WAVE
    • Publication number 20120285247
    • Publication date Nov 15, 2012
    • IHI INSPECTION & INSTRUMENTATION CO., LTD.
    • Koki Daikoku
    • G01 - MEASURING TESTING