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Koki Kawamura
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Chiba, JP
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last 30 patents
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Patent Application
Laser Scanner Particle Counter and Imager
Publication number
20170160187
Publication date
Jun 8, 2017
TDK Corporation
Celine Hu
G01 - MEASURING TESTING
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Patent Application
METHOD OF DETECTING AN ANALYTE IN A SAMPLE
Publication number
20160258938
Publication date
Sep 8, 2016
HEADWAY TECHNOLOGIES, INC.
Jaime E. Arenas
G01 - MEASURING TESTING