Koki Tsutsumida

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit
- Patent number 9,291,671
- Issue date Mar 22, 2016
- Hitachi, Ltd.
- Yasuyoshi Sunaga
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,618,823
- Issue date Dec 31, 2013
- Hitachi, Ltd.
- Kenichi Tada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device for scan testing
- Patent number 8,086,889
- Issue date Dec 27, 2011
- Hitachi, Ltd.
- Yuichi Ito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20140070863
- Publication date Mar 13, 2014
- Hitachi, Ltd
- Yasuyoshi Sunaga
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110204908
- Publication date Aug 25, 2011
- Hitachi, Ltd.
- Kenichi Tada
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20110074385
- Publication date Mar 31, 2011
- Hitachi, Ltd.
- Yasuyoshi Sunaga
- G01 - MEASURING TESTING
Information Patent Application
EDA TOOL, SEMICONDUCTOR DEVICE, AND SCAN CHAIN CONFIGURATION METHOD
- Publication number 20100169727
- Publication date Jul 1, 2010
- RENESAS TECHNOLOGY CORP.
- Daisuke ITO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20090113230
- Publication date Apr 30, 2009
- Hitachi, Ltd.
- Yuichi Ito
- G01 - MEASURING TESTING