Kommisetti Subrahmanyam

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
System to detect wafer arcing in semiconductor manufacturing equipment
- Patent number 10,283,421
- Issue date May 7, 2019
- Applied Materials, Inc.
- Scott Singlevich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for integrating manual and automated technique...
- Patent number 9,697,470
- Issue date Jul 4, 2017
- Applied Materials, Inc.
- Jimmy Iskandar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to detect wafer arcing in semiconductor manufacturing equipment
- Patent number 9,508,612
- Issue date Nov 29, 2016
- Applied Materials, Inc.
- Scott Singlevich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Acoustically-monitored semiconductor substrate processing systems a...
- Patent number 9,429,247
- Issue date Aug 30, 2016
- Applied Materials, Inc.
- Kommisetti Subrahmanyam
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM TO DETECT WAFER ARCING IN SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20170077002
- Publication date Mar 16, 2017
- Applied Materials, Inc.
- Scott Singlevich
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INTEGRATING MANUAL AND AUTOMATED TECHNIQUE...
- Publication number 20150302311
- Publication date Oct 22, 2015
- Applied Materials, Inc.
- Jimmy ISKANDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO DETECT WAFER ARCING IN SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20130245969
- Publication date Sep 19, 2013
- Applied Materials, Inc.
- Scott Singlevich
- G01 - MEASURING TESTING