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Konosuke Murakami

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  • Mitaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Prober
    • Patent number 9,519,009
    • Issue date Dec 13, 2016
    • Tokyo Seimitsu Co., Ltd.
    • Konosuke Murakami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Chip mis-position detection method
    • Patent number 7,129,507
    • Issue date Oct 31, 2006
    • Tokyo Seimitsu Co., Ltd.
    • Akira Yamamoto
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBER
    • Publication number 20150137842
    • Publication date May 21, 2015
    • TOKYO SEIMITSU CO., LTD.
    • Konosuke Murakami
    • G01 - MEASURING TESTING
  • Information Patent Application

    Chip mis-position detection method
    • Publication number 20050173702
    • Publication date Aug 11, 2005
    • Akira Yamamoto
    • H01 - BASIC ELECTRIC ELEMENTS