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Konosuke Oishi
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Katsuta, JP
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last 30 patents
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Patent Grant
Mass spectrometer, skimmer cone assembly, skimmer cone and its manu...
Patent number
5,793,039
Issue date
Aug 11, 1998
Hitachi Ltd.
Konosuke Oishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analyzer using plasma and analysis method using plasma, interface u...
Patent number
5,763,877
Issue date
Jun 9, 1998
Hitachi, Ltd.
Konosuke Oishi
G01 - MEASURING TESTING
Information
Patent Grant
Plasma ion mass spectrometer and plasma mass spectrometry using the...
Patent number
5,616,918
Issue date
Apr 1, 1997
Hitachi, Ltd.
Konosuke Oishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma mass spectrometer
Patent number
5,308,977
Issue date
May 3, 1994
Hitachi, Ltd.
Konosuke Oishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-element simultaneous analysis atomic absorption spectroscopy...
Patent number
5,283,624
Issue date
Feb 1, 1994
Hitachi, Ltd.
Masamichi Tsukada
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer using plasma ion source
Patent number
5,148,021
Issue date
Sep 15, 1992
Hitachi, Ltd.
Yukio Okamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Atomic absorption spectrophotometer and electromagnetic shut-off va...
Patent number
5,108,178
Issue date
Apr 28, 1992
Hitachi, Ltd.
Konosuke Oishi
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer and analyzing method
Patent number
5,104,220
Issue date
Apr 14, 1992
Hitachi, Ltd.
Toyoharu Okumoto
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer
Patent number
4,948,250
Issue date
Aug 14, 1990
Hitachi, Ltd.
Konosuke Oishi
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer
Patent number
4,890,919
Issue date
Jan 2, 1990
Hitachi, Ltd.
Masamichi Tsukada
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer
Patent number
4,867,562
Issue date
Sep 19, 1989
Hitachi, Ltd.
Konosuke Oishi
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer with furnace at pressure equal...
Patent number
4,840,484
Issue date
Jun 20, 1989
Hitachi, Ltd.
Konosuke Oishi
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer
Patent number
4,728,189
Issue date
Mar 1, 1988
Hitachi, Ltd. Hitachi Instrument Eng.
Konosuke Oishi
G01 - MEASURING TESTING
Information
Patent Grant
Double polarized light beam spectrophotometer of light source modul...
Patent number
4,645,341
Issue date
Feb 24, 1987
Hitachi, Ltd.
Masataka Koga
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometric analyzer having dual monochromators
Patent number
4,468,121
Issue date
Aug 28, 1984
Hitachi, Ltd.
Hideaki Koizumi
G01 - MEASURING TESTING
Information
Patent Grant
Spectral source, particularly for atomic absorption spectrometry
Patent number
4,198,589
Issue date
Apr 15, 1980
Hitachi, Ltd.
Shinji Mayama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light source lamp with particular envelope structure to accommodate...
Patent number
4,100,446
Issue date
Jul 11, 1978
Hitachi, Ltd.
Katsuhito Harada
G01 - MEASURING TESTING