Konrad Herrmann

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Muenchen, DE

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Patents Applicationslast 30 patents

Information Patent Application
Test method, test receptacle and test arrangement for high-speed se...
- Publication number 20050033949
- Publication date Feb 10, 2005
- Konrad Herrmann
- G01 - MEASURING TESTING
Information Patent Application
Test method and apparatus for high-speed semiconductor memory devices
- Publication number 20050028062
- Publication date Feb 3, 2005
- Konrad Herrmann
- G11 - INFORMATION STORAGE