Konstantin Chirko

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
- Patent number 11,953,316
- Issue date Apr 9, 2024
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G01 - MEASURING TESTING
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generating three dimensional information regarding structural eleme...
- Patent number 11,264,202
- Issue date Mar 1, 2022
- Applied Materials Israel Ltd.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filling empty structures with deposition under high-energy SEM for...
- Patent number 10,903,044
- Issue date Jan 26, 2021
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring a height profile of a hole formed in non-conductive region
- Patent number 10,714,306
- Issue date Jul 14, 2020
- Applied Materials Israel Ltd.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging bottom of high aspect ratio holes
- Patent number 9,632,044
- Issue date Apr 25, 2017
- Applied Materials Isreal Ltd
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining a state of a high aspect ratio hole using measurement r...
- Patent number 9,448,253
- Issue date Sep 20, 2016
- Applied Materials Israel Ltd.
- Konstantin Chirko
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic chuck and a method for supporting a wafer
- Patent number 8,804,299
- Issue date Aug 12, 2014
- Applied Materials Israel, Ltd.
- Guy Eytan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPY-BASED TOMOGRAPHY OF SPECIMENS
- Publication number 20240404784
- Publication date Dec 5, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Itamar Shani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAME...
- Publication number 20240249909
- Publication date Jul 25, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL RECONSTRUCTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220082376
- Publication date Mar 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING THREE DIMENSIONAL INFORMATION REGARDING STRUCTURAL ELEME...
- Publication number 20210358712
- Publication date Nov 18, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING A HEIGHT PROFILE OF A HOLE FORMED IN NON-CONDUCTIVE REGION
- Publication number 20190378683
- Publication date Dec 12, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING A STATE OF A HIGH ASPECT RATIO HOLE USING MEASUREMENT R...
- Publication number 20150362524
- Publication date Dec 17, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Konstantin Chirko
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC CHUCK AND A METHOD FOR SUPPORTING A WAFER
- Publication number 20120262834
- Publication date Oct 18, 2012
- Guy Eytan
- H01 - BASIC ELECTRIC ELEMENTS

Konstantin Chirko

Person

Patents Grantslast 30 patents

Geometry based three dimensional reconstruction of a semiconductor...

Lateral recess measurement in a semiconductor specimen

Generating three dimensional information regarding structural eleme...

Filling empty structures with deposition under high-energy SEM for...

Measuring a height profile of a hole formed in non-conductive region

Imaging bottom of high aspect ratio holes

Determining a state of a high aspect ratio hole using measurement r...

Electrostatic chuck and a method for supporting a wafer

Patents Applicationslast 30 patents

SCANNING ELECTRON MICROSCOPY-BASED TOMOGRAPHY OF SPECIMENS

FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAME...

LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN

THREE-DIMENSIONAL RECONSTRUCTION OF A SEMICONDUCTOR SPECIMEN

GENERATING THREE DIMENSIONAL INFORMATION REGARDING STRUCTURAL ELEME...

MEASURING A HEIGHT PROFILE OF A HOLE FORMED IN NON-CONDUCTIVE REGION

DETERMINING A STATE OF A HIGH ASPECT RATIO HOLE USING MEASUREMENT R...

ELECTROSTATIC CHUCK AND A METHOD FOR SUPPORTING A WAFER