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Konstantinos Evangelos Spartiotis
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Athens, GR
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor imaging device and method for producing same
Patent number
6,509,203
Issue date
Jan 21, 2003
Simage, O.Y.
Konstantinos Evangelos Spartiotis
G01 - MEASURING TESTING
Information
Patent Grant
Radiation imaging device with an array of image cells
Patent number
6,355,923
Issue date
Mar 12, 2002
Simage Oy
Jouni Ilari Pyyhtiä
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid semiconductor imaging device having plural readout substrates
Patent number
6,323,475
Issue date
Nov 27, 2001
Simage Oy
Konstantinos Evangelos Spartiotis
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Radiation imaging device with an array of image cells
Patent number
6,248,990
Issue date
Jun 19, 2001
Simage Oy
Jouni Ilari Pyyhtiä
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor imaging device
Patent number
6,207,944
Issue date
Mar 27, 2001
Simage, O.Y.
Konstantinos Evangelos Spartiotis
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Low temperature bump-bonding semiconductor imaging device
Patent number
5,952,646
Issue date
Sep 14, 1999
Simage OY
Konstantinos Evangelos Spartiotis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Radiation imaging device with an array of image cells
Publication number
20020092970
Publication date
Jul 18, 2002
Jouni Ilari Pyyhtia
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR IMAGING DEVICE AND METHOD FOR PRODUCING SAME
Publication number
20020043696
Publication date
Apr 18, 2002
KONSTANTINOS EVANGELOS SPARTIOTIS
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR IMAGING DEVICE AND METHOD FOR PRODUCING SAME
Publication number
20020000549
Publication date
Jan 3, 2002
KONSTANTINOS EVANGELOS SPARTIOTIS
G01 - MEASURING TESTING
Information
Patent Application
Radiation imaging device with an array of image cells
Publication number
20010025914
Publication date
Oct 4, 2001
Jouni Ilari Pyyhtia
G01 - MEASURING TESTING