Kosuke Fujihara

Person

Nagano-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe guide plate and probe device
- Patent number 10,386,387
- Issue date Aug 20, 2019
- Shinko Electric Industries Co., Ltd.
- Kosuke Fujihara
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide plate and probe device
- Patent number 10,309,988
- Issue date Jun 4, 2019
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide plate having a silicon oxide layer formed on surfaces a...
- Patent number 10,261,110
- Issue date Apr 16, 2019
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide, probe card, and method for probe guide manufacturing
- Patent number 10,139,430
- Issue date Nov 27, 2018
- Shinko Electric Industries Co., Ltd.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide plate and semiconductor inspection apparatus
- Patent number 9,829,509
- Issue date Nov 28, 2017
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide plate and method for manufacturing the same
- Patent number 9,523,716
- Issue date Dec 20, 2016
- Shinko Electric Industries Co., Ltd.
- Akinori Shiraishi
- G01 - MEASURING TESTING
Information Patent Grant
Guide plate for probe card
- Patent number 9,459,287
- Issue date Oct 4, 2016
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Teppei Kimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe Guide, Probe Card, And Method For Probe Guide Manufacturing
- Publication number 20170242057
- Publication date Aug 24, 2017
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND PROBE DEVICE
- Publication number 20170205444
- Publication date Jul 20, 2017
- Shinko Electric Industries Co., Ltd.
- Kosuke Fujihara
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND PROBE DEVICE
- Publication number 20170205445
- Publication date Jul 20, 2017
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND PROBE APPARATUS
- Publication number 20170146569
- Publication date May 25, 2017
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND SEMICONDUCTOR INSPECTION APPARATUS
- Publication number 20140354315
- Publication date Dec 4, 2014
- Shinko Electric Industries Co., Ltd.
- Yuichiro SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
GUIDE PLATE FOR PROBE CARD
- Publication number 20140266275
- Publication date Sep 18, 2014
- Shinko Electric Industries Co., Ltd.
- Teppei KIMURA
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20140266274
- Publication date Sep 18, 2014
- Shinko Electric Industries Co., Ltd.
- Akinori Shiraishi
- G01 - MEASURING TESTING

Kosuke Fujihara

Person

Patents Grantslast 30 patents

Probe guide plate and probe device

Probe guide plate and probe device

Probe guide plate having a silicon oxide layer formed on surfaces a...

Probe guide, probe card, and method for probe guide manufacturing

Probe guide plate and semiconductor inspection apparatus

Probe guide plate and method for manufacturing the same

Guide plate for probe card

Patents Applicationslast 30 patents

Probe Guide, Probe Card, And Method For Probe Guide Manufacturing

PROBE GUIDE PLATE AND PROBE DEVICE

PROBE GUIDE PLATE AND PROBE DEVICE

PROBE GUIDE PLATE AND PROBE APPARATUS

PROBE GUIDE PLATE AND SEMICONDUCTOR INSPECTION APPARATUS

GUIDE PLATE FOR PROBE CARD

PROBE GUIDE PLATE AND METHOD FOR MANUFACTURING THE SAME