Kosuke HATOZAKI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor evaluation apparatus and semiconductor evaluation method
- Patent number 9,720,014
- Issue date Aug 1, 2017
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and measuring method utilizing insulating liquid
- Patent number 9,684,015
- Issue date Jun 20, 2017
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR EVALUATION APPARATUS AND SEMICONDUCTOR EVALUATION METHOD
- Publication number 20160116501
- Publication date Apr 28, 2016
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20150362527
- Publication date Dec 17, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING