Kosuke Miyao

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Plating methods for modular and/or ganged waveguides for automatic...
- Patent number 10,944,148
- Issue date Mar 9, 2021
- Advantest Corporation
- Don Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wave interface assembly for automatic test equipment for semiconduc...
- Patent number 10,393,772
- Issue date Aug 27, 2019
- Advantest Corporation
- Don Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multiple waveguide structure with single flange for automatic test...
- Patent number 10,381,707
- Issue date Aug 13, 2019
- Advantest Corporation
- Don Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated waveguide structure and socket structure for millimeter...
- Patent number 10,114,067
- Issue date Oct 30, 2018
- Advantest Corporation
- Daniel Lam
- G01 - MEASURING TESTING
Information Patent Grant
Lumped element radio frequency tuning calibration process
- Patent number 9,647,632
- Issue date May 9, 2017
- Advantest Corporation
- Donald M Lee
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST...
- Publication number 20170229753
- Publication date Aug 10, 2017
- Advantest Corporation
- Don LEE
- G01 - MEASURING TESTING
Information Patent Application
PLATING METHODS FOR MODULAR AND/OR GANGED WAVEGUIDES FOR AUTOMATIC...
- Publication number 20170229757
- Publication date Aug 10, 2017
- Advantest Corporation
- Don LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVE INTERFACE ASSEMBLY FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUC...
- Publication number 20170229754
- Publication date Aug 10, 2017
- Advantest Corporation
- Don LEE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED WAVEGUIDE STRUCTURE AND SOCKET STRUCTURE FOR MILLIMETER...
- Publication number 20170227598
- Publication date Aug 10, 2017
- Advantest Corporation
- Daniel LAM
- G01 - MEASURING TESTING
Information Patent Application
LUMPED ELEMENT RADIO FREQUENCY TUNING CALIBRATION PROCESS
- Publication number 20150162891
- Publication date Jun 11, 2015
- Advantest Corporation
- Donald M. Lee
- G01 - MEASURING TESTING