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Kosuke NAGAE
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Chiyoda-ku, Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Detection device, detection method using said detection device, and...
Patent number
11,215,613
Issue date
Jan 4, 2022
Konica Minolta, Inc.
Kosuke Nagae
G01 - MEASURING TESTING
Information
Patent Grant
Position detection method and position detection device for sensor...
Patent number
10,976,250
Issue date
Apr 13, 2021
Konica Minolta, Inc.
Yukito Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Surface plasmon-enhanced fluorescence measurement device and surfac...
Patent number
10,690,596
Issue date
Jun 23, 2020
Konica Minolta, Inc.
Yukito Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing sensing chip and sensing chip
Patent number
10,677,731
Issue date
Jun 9, 2020
Konica Minolta, Inc.
Yukito Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Surface plasmon enhanced fluorescence measurement device and surfac...
Patent number
10,495,575
Issue date
Dec 3, 2019
Konica Minolta, Inc.
Yukito Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Detection chip and detection method
Patent number
10,254,228
Issue date
Apr 9, 2019
Konica Minolta, Inc.
Kosuke Nagae
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETECTION CHIP, DETECTION SYSTEM, AND DETECTION METHOD
Publication number
20210356386
Publication date
Nov 18, 2021
Tomonori KANEKO
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING SENSING CHIP AND SENSING CHIP
Publication number
20200256796
Publication date
Aug 13, 2020
Konica Minolta, Inc.
Yukito NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
POSITION DETECTION METHOD AND POSITION DETECTION DEVICE FOR SENSOR...
Publication number
20190360934
Publication date
Nov 28, 2019
Konica Minolta, Inc.
Yukito NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Detection Chip and Detection Method
Publication number
20180266954
Publication date
Sep 20, 2018
Konica Minolta, Inc.
Kosuke Nagae
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING SENSING CHIP AND SENSING CHIP
Publication number
20180080872
Publication date
Mar 22, 2018
KONICA MINOLTA, INC.
Yukito NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Surface Plasmon-Enhanced Fluorescence Measurement Device And Surfac...
Publication number
20180017493
Publication date
Jan 18, 2018
Konica Minolta, Inc.
Yukito Nakamura
G01 - MEASURING TESTING
Information
Patent Application
SURFACE PLASMON ENHANCED FLUORESCENCE MEASUREMENT DEVICE AND SURFAC...
Publication number
20170030833
Publication date
Feb 2, 2017
Yukito NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
Detection Device, Detection Method Using Said Detection Device, And...
Publication number
20160266111
Publication date
Sep 15, 2016
Konica Minolta, Inc.
Kosuke NAGAE
G01 - MEASURING TESTING