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Kosuke YAMAGUCHI
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Kobe-shi, JP
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Sample analyzer
Patent number
9,618,504
Issue date
Apr 11, 2017
SYSMEX CORPORATION
Tsukasa Hirata
G01 - MEASURING TESTING
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SAMPLE ANALYZER, SAMPLE ANALYSIS METHOD, AND NON-TRANSITORY STORAGE...
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20140295453
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Oct 2, 2014
SYSMEX CORPORATION
Tsukasa HIRATA
G01 - MEASURING TESTING