Kota FUJIWARA

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Shizuoka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature measuring mask and temperature measuring method
- Patent number 10,670,472
- Issue date Jun 2, 2020
- NuFlare Technology, Inc.
- Kota Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting substrate position of charged particle beam ph...
- Patent number 8,237,139
- Issue date Aug 7, 2012
- Nuflare Technology, Inc.
- Kota Fujiwara
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE MEASURING MASK AND TEMPERATURE MEASURING METHOD
- Publication number 20170115167
- Publication date Apr 27, 2017
- NuFlare Technology, Inc.
- Kota FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING SUBSTRATE POSITION OF CHARGED PARTICLE BEAM PH...
- Publication number 20100290023
- Publication date Nov 18, 2010
- NuFlare Technology, Inc.
- Kota FUJIWARA
- B82 - NANO-TECHNOLOGY