Kota Iwasaki

Person

Atsugi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron beam irradiation apparatus and electron beam irradiation m...
- Patent number 11,664,191
- Issue date May 30, 2023
- NuFlare Technology, Inc.
- Taku Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam writing apparatus and multiple electron beam...
- Patent number 11,621,140
- Issue date Apr 4, 2023
- NuFlare Technology, Inc.
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam irradiation apparatus
- Patent number 11,049,688
- Issue date Jun 29, 2021
- NuFlare Technology, Inc.
- Michihiro Kawaguchi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Information processing device to process spectral information, and...
- Patent number 10,184,885
- Issue date Jan 22, 2019
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle image measuring device and imaging mass spectromet...
- Patent number 9,754,772
- Issue date Sep 5, 2017
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectral data processing apparatus, spectral data processing method...
- Patent number 9,696,203
- Issue date Jul 4, 2017
- Canon Kabushiki Kaisha
- Kota Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Projection-type charged particle optical system and imaging mass sp...
- Patent number 9,679,756
- Issue date Jun 13, 2017
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass image analyzing system
- Patent number 9,627,177
- Issue date Apr 18, 2017
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Projection-type charged particle optical system and imaging mass sp...
- Patent number 9,570,276
- Issue date Feb 14, 2017
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectral image data processing apparatus and two-dimensional spectr...
- Patent number 9,495,753
- Issue date Nov 15, 2016
- Canon Kabushiki Kaisha
- Kota Iwasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass distribution spectrometry method and mass distribution spectro...
- Patent number 9,312,116
- Issue date Apr 12, 2016
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- G01 - MEASURING TESTING
Information Patent Grant
Light source adjustment unit, optical measurement device, subject i...
- Patent number 9,134,246
- Issue date Sep 15, 2015
- Canon Kabushiki Kaisha
- Jumpei Naito
- G01 - MEASURING TESTING
Information Patent Grant
Mass selector, and ion gun, ion irradiation apparatus and mass micr...
- Patent number 8,963,081
- Issue date Feb 24, 2015
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion group irradiation device and secondary ion mass spectrometer
- Patent number 8,963,078
- Issue date Feb 24, 2015
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,957,392
- Issue date Feb 17, 2015
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 8,759,756
- Issue date Jun 24, 2014
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image display apparatus with improved vacuum condition
- Patent number 7,994,699
- Issue date Aug 9, 2011
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Airtight container manufacturing method involves irradiating an ele...
- Patent number 7,959,483
- Issue date Jun 14, 2011
- Canon Kabushiki Kaisha
- Takayuki Sekine
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PHOTOELECTRIC SURFACE ELECTRON SOURCE
- Publication number 20230290605
- Publication date Sep 14, 2023
- Hamamatsu Photonics K.K.
- Tomohiko HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON BEAM WRITING APPARATUS AND MULTI-ELECTRON BEAM WRITI...
- Publication number 20230260748
- Publication date Aug 17, 2023
- NuFlare Technology, Inc.
- Kota IWASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM IRRADIATION APPARATUS AND ELECTRON BEAM IRRADIATION M...
- Publication number 20220189734
- Publication date Jun 16, 2022
- NuFlare Technology, Inc.
- Taku YAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE ELECTRON BEAM WRITING APPARATUS AND MULTIPLE ELECTRON BEAM...
- Publication number 20220059310
- Publication date Feb 24, 2022
- NuFlare Technology, Inc.
- Kota IWASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM IRRADIATION APPARATUS
- Publication number 20200105499
- Publication date Apr 2, 2020
- NuFlare Technology, Inc.
- Michihiro KAWAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING DEVICE TO PROCESS SPECTRAL INFORMATION, AND...
- Publication number 20170322146
- Publication date Nov 9, 2017
- Canon Kabushiki Kaisha
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
PROJECTION-TYPE CHARGED PARTICLE OPTICAL SYSTEM AND IMAGING MASS SP...
- Publication number 20170117127
- Publication date Apr 27, 2017
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE IMAGE MEASURING DEVICE AND IMAGING MASS SPECTROMET...
- Publication number 20170062196
- Publication date Mar 2, 2017
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROJECTION-TYPE CHARGED PARTICLE OPTICAL SYSTEM AND IMAGING MASS SP...
- Publication number 20160141162
- Publication date May 19, 2016
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID DROPLET INJECTING APPARATUS AND ION SOURCE
- Publication number 20160086758
- Publication date Mar 24, 2016
- Canon Kabushiki Kaisha
- Kota Iwasaki
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20150311057
- Publication date Oct 29, 2015
- Canon Kabushiki Kaisha
- Yohei Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS IMAGE ANALYZING SYSTEM
- Publication number 20150155132
- Publication date Jun 4, 2015
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS DISTRIBUTION MEASUREMENT METHOD AND MASS DISTRIBUTION MEASUREM...
- Publication number 20150115148
- Publication date Apr 30, 2015
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS DISTRIBUTION MEASUREMENT METHOD AND MASS DISTRIBUTION MEASUREM...
- Publication number 20150115149
- Publication date Apr 30, 2015
- Canon Kabushiki Kaisha
- Naofumi Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER
- Publication number 20140374587
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374585
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374586
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL DATA PROCESSING APPARATUS, SPECTRAL DATA PROCESSING METHOD...
- Publication number 20140379306
- Publication date Dec 25, 2014
- Kota Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL IMAGE DATA PROCESSING APPARATUS AND TWO-DIMENSIONAL SPECTR...
- Publication number 20140355824
- Publication date Dec 4, 2014
- Canon Kabushiki Kaisha
- Kota Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE ADJUSTMENT UNIT, OPTICAL MEASUREMENT DEVICE, SUBJECT I...
- Publication number 20140353504
- Publication date Dec 4, 2014
- Jumpei Naito
- G02 - OPTICS
Information Patent Application
MASS SELECTOR, AND ION GUN, ION IRRADIATION APPARATUS AND MASS MICR...
- Publication number 20140252225
- Publication date Sep 11, 2014
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20140239173
- Publication date Aug 28, 2014
- Canon Kabushiki Kaisha
- Kota Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
MASS DISTRIBUTION SPECTROMETRY METHOD AND MASS DISTRIBUTION SPECTRO...
- Publication number 20140224979
- Publication date Aug 14, 2014
- Canon Kabushiki Kaisha
- Masafumi Kyogaku
- G01 - MEASURING TESTING
Information Patent Application
ION MASS SELECTOR, ION IRRADIATION DEVICE, SURFACE ANALYSIS DEVICE,...
- Publication number 20140138533
- Publication date May 22, 2014
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPERSONIC BEAM APPARATUS AND CLUSTER ION BEAM FORMING METHOD
- Publication number 20140110244
- Publication date Apr 24, 2014
- Canon Kabushiki Kaisha
- Kota Iwasaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20130270432
- Publication date Oct 17, 2013
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHODS OF AIRTIGHT CONTAINER AND IMAGE DISPLAY APPAR...
- Publication number 20090291611
- Publication date Nov 26, 2009
- Canon Kabushiki Kaisha
- Takayuki Sekine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE DISPLAY APPARATUS
- Publication number 20090212701
- Publication date Aug 27, 2009
- Canon Kabushiki Kaisha
- Kota Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS

Kota Iwasaki

Person

Patents Grantslast 30 patents

Electron beam irradiation apparatus and electron beam irradiation m...

Multiple electron beam writing apparatus and multiple electron beam...

Charged particle beam irradiation apparatus

Information processing device to process spectral information, and...

Charged particle image measuring device and imaging mass spectromet...

Spectral data processing apparatus, spectral data processing method...

Projection-type charged particle optical system and imaging mass sp...

Mass spectrometer and mass image analyzing system

Projection-type charged particle optical system and imaging mass sp...

Spectral image data processing apparatus and two-dimensional spectr...

Mass distribution spectrometry method and mass distribution spectro...

Light source adjustment unit, optical measurement device, subject i...

Mass selector, and ion gun, ion irradiation apparatus and mass micr...

Ion group irradiation device and secondary ion mass spectrometer

Mass spectrometer

Time-of-flight mass spectrometer

Image display apparatus with improved vacuum condition

Airtight container manufacturing method involves irradiating an ele...

Patents Applicationslast 30 patents

PHOTOELECTRIC SURFACE ELECTRON SOURCE

MULTI-ELECTRON BEAM WRITING APPARATUS AND MULTI-ELECTRON BEAM WRITI...

ELECTRON BEAM IRRADIATION APPARATUS AND ELECTRON BEAM IRRADIATION M...

MULTIPLE ELECTRON BEAM WRITING APPARATUS AND MULTIPLE ELECTRON BEAM...

CHARGED PARTICLE BEAM IRRADIATION APPARATUS

INFORMATION PROCESSING DEVICE TO PROCESS SPECTRAL INFORMATION, AND...

PROJECTION-TYPE CHARGED PARTICLE OPTICAL SYSTEM AND IMAGING MASS SP...

CHARGED PARTICLE IMAGE MEASURING DEVICE AND IMAGING MASS SPECTROMET...

PROJECTION-TYPE CHARGED PARTICLE OPTICAL SYSTEM AND IMAGING MASS SP...

LIQUID DROPLET INJECTING APPARATUS AND ION SOURCE

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

MASS SPECTROMETER AND MASS IMAGE ANALYZING SYSTEM

MASS DISTRIBUTION MEASUREMENT METHOD AND MASS DISTRIBUTION MEASUREM...

MASS DISTRIBUTION MEASUREMENT METHOD AND MASS DISTRIBUTION MEASUREM...

ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

SPECTRAL DATA PROCESSING APPARATUS, SPECTRAL DATA PROCESSING METHOD...

SPECTRAL IMAGE DATA PROCESSING APPARATUS AND TWO-DIMENSIONAL SPECTR...

LIGHT SOURCE ADJUSTMENT UNIT, OPTICAL MEASUREMENT DEVICE, SUBJECT I...

MASS SELECTOR, AND ION GUN, ION IRRADIATION APPARATUS AND MASS MICR...

MASS SPECTROMETER

MASS DISTRIBUTION SPECTROMETRY METHOD AND MASS DISTRIBUTION SPECTRO...

ION MASS SELECTOR, ION IRRADIATION DEVICE, SURFACE ANALYSIS DEVICE,...

SUPERSONIC BEAM APPARATUS AND CLUSTER ION BEAM FORMING METHOD

TIME-OF-FLIGHT MASS SPECTROMETER

MANUFACTURING METHODS OF AIRTIGHT CONTAINER AND IMAGE DISPLAY APPAR...

IMAGE DISPLAY APPARATUS