Kotaro HASEGAWA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 12,130,324
- Issue date Oct 29, 2024
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 11,800,619
- Issue date Oct 24, 2023
- Advantest Corporation
- Kotaro Hasegawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 11,788,885
- Issue date Oct 17, 2023
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for determining pass or fail of LEDs, test method an...
- Patent number 11,293,966
- Issue date Apr 5, 2022
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...
- Publication number 20250067800
- Publication date Feb 27, 2025
- Advantest Corporation
- Koji MIYAUCHI
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20250012847
- Publication date Jan 9, 2025
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...
- Publication number 20240110969
- Publication date Apr 4, 2024
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220276090
- Publication date Sep 1, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220232685
- Publication date Jul 21, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220221504
- Publication date Jul 14, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD AND COMPUTER-READABLE MEDIUM
- Publication number 20200379029
- Publication date Dec 3, 2020
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING

Kotaro HASEGAWA

Person

Patents Grantslast 30 patents

Test apparatus, test method, and computer-readable storage medium

Test apparatus, test method, and computer-readable storage medium

Test apparatus, test method, and computer-readable storage medium

Test apparatus for determining pass or fail of LEDs, test method an...

Patents Applicationslast 30 patents

TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD AND COMPUTER-READABLE MEDIUM