Kotaro Hori

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inspecting wafer surface, method for inspecting wafer...
- Patent number 7,383,156
- Issue date Jun 3, 2008
- Sumco Techxiv Kabushiki Kaisha
- Kouzou Matsusita
- G01 - MEASURING TESTING
Information Patent Grant
Laser marking method for semiconductor wafer
- Patent number 6,248,973
- Issue date Jun 19, 2001
- Komatsu Limited
- Yukinori Matsumura
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for inspecting wafer surface, method for inspecting wafer...
- Publication number 20040036863
- Publication date Feb 26, 2004
- Kouzou Matsusita
- G01 - MEASURING TESTING