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Kotaro Maruyama

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  • Yokohama, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Pattern defect detection method
    • Patent number 10,802,073
    • Issue date Oct 13, 2020
    • TASMIT, INC.
    • Ryo Shimoda
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PATTERN DEFECT DETECTION METHOD
    • Publication number 20230177673
    • Publication date Jun 8, 2023
    • TASMIT, INC.
    • Kotaro MARUYAMA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    IMAGE GENERATION METHOD
    • Publication number 20220180041
    • Publication date Jun 9, 2022
    • TASMIT, INC.
    • Kotaro MARUYAMA
    • G06 - COMPUTING CALCULATING COUNTING