Kotoko Urano

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement system and method for setting observation conditions of...
- Patent number 11,380,518
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and aberration correction method for c...
- Patent number 10,727,024
- Issue date Jul 28, 2020
- Hitachi High-Technologies Corporation
- Kotoko Urano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration correction method, aberration correction system, and cha...
- Patent number 10,446,361
- Issue date Oct 15, 2019
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and arithmetic device
- Patent number 9,530,614
- Issue date Dec 27, 2016
- Hitachi High-Technologies Corporation
- Kotoko Urano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole and charged particle radiation apparatus using the same
- Patent number 9,343,260
- Issue date May 17, 2016
- Hitachi High-Technologies Corporation
- Kotoko Urano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration corrector and charged particle beam apparatus using the...
- Patent number 9,287,084
- Issue date Mar 15, 2016
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole measurement apparatus
- Patent number 8,987,680
- Issue date Mar 24, 2015
- Hitachi High-Technologies Corporation
- Tomonori Nakano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Measurement System and Method for Setting Observation Conditions of...
- Publication number 20210407763
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND ABERRATION CORRECTION METHOD FOR C...
- Publication number 20190214222
- Publication date Jul 11, 2019
- Hitachi High-Technologies Corporation
- Kotoko URANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION CORRECTION METHOD, ABERRATION CORRECTION SYSTEM, AND CHA...
- Publication number 20180190469
- Publication date Jul 5, 2018
- Hitachi High-Technologies Corporation
- Zhaohui CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE...
- Publication number 20150248944
- Publication date Sep 3, 2015
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND ARITHMETIC DEVICE
- Publication number 20150060654
- Publication date Mar 5, 2015
- Hitachi High-Technolgies Corporation
- Kotoko Urano
- G01 - MEASURING TESTING
Information Patent Application
MULTIPOLE MEASUREMENT APPARATUS
- Publication number 20140217304
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Tomonori Nakano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
MULTIPOLE AND CHARGED PARTICLE RADIATION APPARATUS USING THE SAME
- Publication number 20130320227
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Kotoko Urano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE PROVIDED WITH AUTOMATIC ABERRATION COR...
- Publication number 20130068949
- Publication date Mar 21, 2013
- Kotoko Urano
- H01 - BASIC ELECTRIC ELEMENTS

Kotoko Urano

Person

Patents Grantslast 30 patents

Measurement system and method for setting observation conditions of...

Charged particle beam device and aberration correction method for c...

Aberration correction method, aberration correction system, and cha...

Charged particle beam device and arithmetic device

Multipole and charged particle radiation apparatus using the same

Aberration corrector and charged particle beam apparatus using the...

Multipole measurement apparatus

Patents Applicationslast 30 patents

Measurement System and Method for Setting Observation Conditions of...

CHARGED PARTICLE BEAM DEVICE AND ABERRATION CORRECTION METHOD FOR C...

ABERRATION CORRECTION METHOD, ABERRATION CORRECTION SYSTEM, AND CHA...

ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE...

CHARGED PARTICLE BEAM DEVICE AND ARITHMETIC DEVICE

MULTIPOLE MEASUREMENT APPARATUS

MULTIPOLE AND CHARGED PARTICLE RADIATION APPARATUS USING THE SAME

CHARGED PARTICLE BEAM DEVICE PROVIDED WITH AUTOMATIC ABERRATION COR...