Kouichi Aoyagi

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 6,647,090
- Issue date Nov 11, 2003
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer
- Patent number 6,337,897
- Issue date Jan 8, 2002
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer useable as wavelength dispersive type an...
- Patent number 6,292,532
- Issue date Sep 18, 2001
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-ray fluorescence spectrometer
- Publication number 20020172322
- Publication date Nov 21, 2002
- Naoki Kawahara
- G01 - MEASURING TESTING