Kouichi Gotou

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device, test circuit and test method
- Patent number 7,652,943
- Issue date Jan 26, 2010
- NEC Electronics Corporation
- Hiroyuki Takahashi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory device, test circuit and test method
- Publication number 20060039220
- Publication date Feb 23, 2006
- NEC Electronics Corporation
- Hiroyuki Takahashi
- G11 - INFORMATION STORAGE