Kouichi Hayakawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Recipe information presentation system and recipe error inference s...
- Patent number 12,174,245
- Issue date Dec 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Kouichi Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing method and apparatus using the same
- Patent number 8,234,651
- Issue date Jul 31, 2012
- Sony Computer Entertainment Inc.
- Kouichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit-pattern inspection apparatus
- Patent number 7,532,328
- Issue date May 12, 2009
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 7,348,558
- Issue date Mar 25, 2008
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Circuit-pattern inspection apparatus
- Patent number 7,292,327
- Issue date Nov 6, 2007
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus for circuit pattern
- Patent number 7,223,975
- Issue date May 29, 2007
- Hitachi, Ltd.
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 7,030,394
- Issue date Apr 18, 2006
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 6,825,480
- Issue date Nov 30, 2004
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ERROR CAUSE ESTIMATION DEVICE AND ESTIMATION METHOD
- Publication number 20230122653
- Publication date Apr 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Recipe Information Presentation System and Recipe Error Inference S...
- Publication number 20220334172
- Publication date Oct 20, 2022
- Hitachi High-Tech Corporation
- Kouichi HAYAKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS FOR CIRCUIT PATTERN
- Publication number 20100019148
- Publication date Jan 28, 2010
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING METHOD AND APPARATUS USING THE SAME
- Publication number 20090307701
- Publication date Dec 10, 2009
- Sony Computer Entertainment Inc.
- Kouichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit-pattern inspection apparatus
- Publication number 20080174772
- Publication date Jul 24, 2008
- Hitachi, Ltd
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection apparatus for circuit pattern
- Publication number 20070284526
- Publication date Dec 13, 2007
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Information processing method and information processing apparatus...
- Publication number 20070028240
- Publication date Feb 1, 2007
- Kouichi Hayakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Publication number 20060289751
- Publication date Dec 28, 2006
- Hitachi, Ltd
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Focus correction method for inspection of circuit patterns
- Publication number 20060284088
- Publication date Dec 21, 2006
- Fumihiko Fukunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Publication number 20050092930
- Publication date May 5, 2005
- Hitachi, Ltd. Incorporation
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Circuit-pattern inspection apparatus
- Publication number 20050043903
- Publication date Feb 24, 2005
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection apparatus for circuit pattern
- Publication number 20040227079
- Publication date Nov 18, 2004
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS

Kouichi Hayakawa

Person

Patents Grantslast 30 patents

Recipe information presentation system and recipe error inference s...

Information processing method and apparatus using the same

Circuit-pattern inspection apparatus

Charged particle beam apparatus and automatic astigmatism adjustmen...

Circuit-pattern inspection apparatus

Inspection apparatus for circuit pattern

Charged particle beam apparatus and automatic astigmatism adjustmen...

Charged particle beam apparatus and automatic astigmatism adjustmen...

Patents Applicationslast 30 patents

ERROR CAUSE ESTIMATION DEVICE AND ESTIMATION METHOD

Recipe Information Presentation System and Recipe Error Inference S...

INSPECTION APPARATUS FOR CIRCUIT PATTERN

INFORMATION PROCESSING METHOD AND APPARATUS USING THE SAME

Circuit-pattern inspection apparatus

Inspection apparatus for circuit pattern

Information processing method and information processing apparatus...

Charged particle beam apparatus and automatic astigmatism adjustmen...

Focus correction method for inspection of circuit patterns

Charged particle beam apparatus and automatic astigmatism adjustmen...

Circuit-pattern inspection apparatus

Inspection apparatus for circuit pattern