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Kouichi Ikeda
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Device and method for testing semiconductor device
Patent number
8,917,103
Issue date
Dec 23, 2014
Ricoh Company, Ltd.
Koichi Morino
G01 - MEASURING TESTING
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Patent Grant
Device and method for testing semiconductor device
Patent number
8,860,445
Issue date
Oct 14, 2014
Ricoh Company, Ltd.
Koichi Morino
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20120032696
Publication date
Feb 9, 2012
RICOH COMPANY, LTD.
Koichi Morino
G01 - MEASURING TESTING