Kouichi Kurosawa

Person

Hitachi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged-particle beam device and cross-sectional shape estimation p...
- Patent number 11,443,914
- Issue date Sep 13, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle ray device and cross-sectional shape estimation pr...
- Patent number 11,133,147
- Issue date Sep 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle ray device and cross-sectional shape estimation pr...
- Patent number 11,101,100
- Issue date Aug 24, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam device
- Patent number 10,964,508
- Issue date Mar 30, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuzuru Mizuhara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,541,103
- Issue date Jan 21, 2020
- Hitachi High-Technologies Corporation
- Yuzuru Mizuhara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrasonic observation equipment, ultrasonic observation system, an...
- Patent number 9,753,017
- Issue date Sep 5, 2017
- Hitachi - GE Nuclear Energy, Ltd.
- Naoyuki Kono
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Evaluation method of residual stress in water jet peening and metho...
- Patent number 8,776,565
- Issue date Jul 15, 2014
- Hitachi, Ltd.
- Hisamitu Hatou
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Water jet peening method and apparatus thereof
- Patent number 8,387,427
- Issue date Mar 5, 2013
- Hitachi - GE Nuclear Energy, Ltd.
- Yuji Matsui
- C21 - METALLURGY OF IRON
Information Patent Grant
Inspection apparatus having a heating mechanism for performing samp...
- Patent number 8,040,146
- Issue date Oct 18, 2011
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method
- Patent number 7,663,390
- Issue date Feb 16, 2010
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,081,625
- Issue date Jul 25, 2006
- Hitachi High-Technologies Corporation
- Masanari Furiki
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale standard sample and its manufacturing method
- Patent number 6,972,405
- Issue date Dec 6, 2005
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for repairing inside of reactor pressure vessel
- Patent number 6,636,579
- Issue date Oct 21, 2003
- Hitachi, Ltd.
- Kouichi Kurosawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Charged-Particle Beam Device and Cross-Sectional Shape Estimation P...
- Publication number 20210366685
- Publication date Nov 25, 2021
- Hitachi High-Tech Corporation
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RAY DEVICE AND CROSS-SECTIONAL SHAPE ESTIMATION PR...
- Publication number 20200294756
- Publication date Sep 17, 2020
- Hitachi High-Technologies Corporation
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle Beam Device
- Publication number 20200258713
- Publication date Aug 13, 2020
- Hitachi High-Technologies Corporation
- Yuzuru MIZUHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20170345613
- Publication date Nov 30, 2017
- Hitachi High-Technologies Corporation
- Yuzuru MIZUHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ultrasonic Observation Equipment, Ultrasonic Observation System, an...
- Publication number 20140355378
- Publication date Dec 4, 2014
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Naoyuki KONO
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION METHOD OF RESIDUAL STRESS IN WATER JET PEENING AND METHO...
- Publication number 20110232348
- Publication date Sep 29, 2011
- Hisamitu HATOU
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Water Jet Peening Method and Apparatus Thereof
- Publication number 20110005288
- Publication date Jan 13, 2011
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Yuji MATSUI
- C21 - METALLURGY OF IRON
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20100123474
- Publication date May 20, 2010
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20090009203
- Publication date Jan 8, 2009
- Takeshi SUNAOSHI
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20050194536
- Publication date Sep 8, 2005
- Masanari Furiki
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale standard sample and its manufacturing method
- Publication number 20050017162
- Publication date Jan 27, 2005
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20040129879
- Publication date Jul 8, 2004
- Masanari Furiki
- G01 - MEASURING TESTING
Information Patent Application
Device and method for repairing inside of reactor pressure vessel
- Publication number 20030128794
- Publication date Jul 10, 2003
- HITACHI, LTD., BABCOCK-HITACHI K.K.
- Kouichi Kurosawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Device and method for repairing inside of reactor pressure vessel
- Publication number 20020064250
- Publication date May 30, 2002
- Kouichi Kurosawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Kouichi Kurosawa

Person

Patents Grantslast 30 patents

Charged-particle beam device and cross-sectional shape estimation p...

Charged particle ray device and cross-sectional shape estimation pr...

Charged particle ray device and cross-sectional shape estimation pr...

Charged-particle beam device

Charged particle beam device

Ultrasonic observation equipment, ultrasonic observation system, an...

Evaluation method of residual stress in water jet peening and metho...

Water jet peening method and apparatus thereof

Inspection apparatus having a heating mechanism for performing samp...

Inspection apparatus and method

Charged particle beam apparatus

Nanoscale standard sample and its manufacturing method

Device and method for repairing inside of reactor pressure vessel

Patents Applicationslast 30 patents

Charged-Particle Beam Device and Cross-Sectional Shape Estimation P...

CHARGED PARTICLE RAY DEVICE AND CROSS-SECTIONAL SHAPE ESTIMATION PR...

Charged-Particle Beam Device

Charged Particle Beam Device

Ultrasonic Observation Equipment, Ultrasonic Observation System, an...

EVALUATION METHOD OF RESIDUAL STRESS IN WATER JET PEENING AND METHO...

Water Jet Peening Method and Apparatus Thereof

INSPECTION APPARATUS AND METHOD

INSPECTION APPARATUS AND METHOD

Charged particle beam apparatus

Nanoscale standard sample and its manufacturing method

Charged particle beam apparatus

Device and method for repairing inside of reactor pressure vessel

Device and method for repairing inside of reactor pressure vessel