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Kouichi Miyashita
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Aichi, JP
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last 30 patents
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Patent Grant
Filter inspection method and filter inspection apparatus
Patent number
8,966,959
Issue date
Mar 3, 2015
NGK Insulators, Ltd.
Kouichi Miyashita
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting defect of article to be inspected
Patent number
8,422,014
Issue date
Apr 16, 2013
NGK Insulators, Ltd.
Tatsuhiko Hatano
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and inspection apparatus for detecting defects
Patent number
7,012,678
Issue date
Mar 14, 2006
NGK Insulators, Ltd.
Akio Enomoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FILTER INSPECTION METHOD AND FILTER INSPECTION APPARATUS
Publication number
20120247224
Publication date
Oct 4, 2012
NGK Insulators, Ltd.
Kouichi MIYASHITA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
METHOD FOR INSPECTING DEFECT OF ARTICLE TO BE INSPECTED
Publication number
20100201983
Publication date
Aug 12, 2010
NGK Insulators, Ltd.
Tatsuhiko Hatano
G01 - MEASURING TESTING
Information
Patent Application
Inspection method and device for detecting defect
Publication number
20030112437
Publication date
Jun 19, 2003
Akio Enomoto
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL