TREA

Kouichi Tamura

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Micro area analyzing method
    • Patent number 5,541,973
    • Issue date Jul 30, 1996
    • Seiko Instruments Inc.
    • Kouichi Tamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    X-ray image sensor
    • Patent number 4,910,405
    • Issue date Mar 20, 1990
    • Seiko Instruments Inc.
    • Hiroyuki Suzuki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents