Kouichiro Akiyama

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Terahertz wave attenuated total reflection spectroscopic method, te...
- Patent number 11,774,357
- Issue date Oct 3, 2023
- Hamamatsu Photonics K.K.
- Kazuhiro Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Fermentation state monitoring apparatus and fermentation state moni...
- Patent number 11,293,859
- Issue date Apr 5, 2022
- HAMAMATSU PHOTONICS K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Non-linear optical crystal and method for manufacturing same, and t...
- Patent number 10,248,003
- Issue date Apr 2, 2019
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Terahertz-wave spectrometer
- Patent number 9,696,206
- Issue date Jul 4, 2017
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Prism member, terahertz-wave spectroscopic measurement device, and...
- Patent number 9,417,182
- Issue date Aug 16, 2016
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Drug evaluation method and drug evaluation device
- Patent number 9,157,851
- Issue date Oct 13, 2015
- Hamamatsu Photonics K.K.
- Gen Takebe
- G01 - MEASURING TESTING
Information Patent Grant
Drug evaluation method and drug evaluation device
- Patent number 9,128,041
- Issue date Sep 8, 2015
- HAMAMATSU PHOTONICS K.K.
- Gen Takebe
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-wave spectrometer and prism member
- Patent number 9,080,913
- Issue date Jul 14, 2015
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEMBER, OPTICAL ELEMENT AND METHOD FOR PRODUCING OPTICAL ME...
- Publication number 20250102429
- Publication date Mar 27, 2025
- Hamamatsu Photonics K.K.
- Kouichiro AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL FORM DETERMINATION METHOD
- Publication number 20240418641
- Publication date Dec 19, 2024
- Hamamatsu Photonics K.K.
- Kazuhiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
ATTENUATED TOTAL REFLECTANCE SPECTROSCOPY APPARATUS, AND ATTENUATED...
- Publication number 20240175811
- Publication date May 30, 2024
- Hamamatsu Photonics K.K.
- Kazuki HORITA
- G01 - MEASURING TESTING
Information Patent Application
DISPERSION STABILITY EVALUATION METHOD, AND DISPERSION STABILITY CO...
- Publication number 20240142360
- Publication date May 2, 2024
- Hamamatsu Photonics K.K.
- Kazuhiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
HYGROSCOPICITY EVALUATION METHOD AND WATER CONTENT EVALUATION METHOD
- Publication number 20230258620
- Publication date Aug 17, 2023
- HAMAMATSU PHOTONICS K. K.
- Tetsuya UCHIDA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE ATTENUATED TOTAL REFLECTION SPECTROSCOPIC METHOD, TE...
- Publication number 20220091027
- Publication date Mar 24, 2022
- HAMAMATSU PHOTONICS K. K.
- Kazuhiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
FERMENTATION STATE MONITORING APPARATUS AND FERMENTATION STATE MONI...
- Publication number 20200173916
- Publication date Jun 4, 2020
- HAMAMATSU PHOTONICS K. K.
- Kouichiro AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
NON-LINEAR OPTICAL CRYSTAL AND METHOD FOR MANUFACTURING SAME, AND T...
- Publication number 20170248833
- Publication date Aug 31, 2017
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G02 - OPTICS
Information Patent Application
PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND...
- Publication number 20150136986
- Publication date May 21, 2015
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ-WAVE SPECTROMETER
- Publication number 20140014840
- Publication date Jan 16, 2014
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD
- Publication number 20140008541
- Publication date Jan 9, 2014
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER
- Publication number 20140008540
- Publication date Jan 9, 2014
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
DRUG EVALUATION METHOD AND DRUG EVALUATION DEVICE
- Publication number 20130187050
- Publication date Jul 25, 2013
- HAMAMATSU PHOTONICS K. K.
- Gen TAKEBE
- G01 - MEASURING TESTING

Kouichiro Akiyama

Person

Patents Grantslast 30 patents

Terahertz wave attenuated total reflection spectroscopic method, te...

Fermentation state monitoring apparatus and fermentation state moni...

Non-linear optical crystal and method for manufacturing same, and t...

Terahertz-wave spectrometer

Prism member, terahertz-wave spectroscopic measurement device, and...

Drug evaluation method and drug evaluation device

Drug evaluation method and drug evaluation device

Terahertz-wave spectrometer and prism member

Patents Applicationslast 30 patents

OPTICAL MEMBER, OPTICAL ELEMENT AND METHOD FOR PRODUCING OPTICAL ME...

CRYSTAL FORM DETERMINATION METHOD

ATTENUATED TOTAL REFLECTANCE SPECTROSCOPY APPARATUS, AND ATTENUATED...

DISPERSION STABILITY EVALUATION METHOD, AND DISPERSION STABILITY CO...

HYGROSCOPICITY EVALUATION METHOD AND WATER CONTENT EVALUATION METHOD

TERAHERTZ WAVE ATTENUATED TOTAL REFLECTION SPECTROSCOPIC METHOD, TE...

FERMENTATION STATE MONITORING APPARATUS AND FERMENTATION STATE MONI...

NON-LINEAR OPTICAL CRYSTAL AND METHOD FOR MANUFACTURING SAME, AND T...

PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND...

TERAHERTZ-WAVE SPECTROMETER

TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD

TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER

DRUG EVALUATION METHOD AND DRUG EVALUATION DEVICE