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Kouichirou Hayashida
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Hiratsuka-shi, JP
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last 30 patents
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Patent Grant
Nitrogen doped silicon wafer and manufacturing method thereof
Patent number
7,875,117
Issue date
Jan 25, 2011
Sumco Techxiv Corporation
Kouzo Nakamura
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
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Patent Grant
Silicon wafer and method for manufacture thereof, and method for ev...
Patent number
6,800,132
Issue date
Oct 5, 2004
Komatsu Denshi Sinzoku Kabushiki
Satoshi Komiya
C30 - CRYSTAL GROWTH
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Patent Grant
Method of evaluating silicon wafers
Patent number
5,943,549
Issue date
Aug 24, 1999
Komatsu Electronics Metals Co., Ltd.
Hisami Motoura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
NITORGEN DOPED SILICON WAFER AND MANUFACTURING METHOD THEREOF
Publication number
20070218570
Publication date
Sep 20, 2007
KOMATSU ELECTRONIC METALS CO., LTD
Kouzo Nakamura
C30 - CRYSTAL GROWTH
Information
Patent Application
Epitaxial silicon wafer
Publication number
20040065250
Publication date
Apr 8, 2004
Komatsu Denshi Kinzoku Kabushiki Kaisha
Satoshi Komiya
C30 - CRYSTAL GROWTH