Kouji Egawa

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring method and instrument comprising image sensor
- Patent number 7,274,829
- Issue date Sep 25, 2007
- ARKRAY, Inc.
- Atsusi Wada
- G01 - MEASURING TESTING
Information Patent Grant
Correction method for sensor output
- Patent number 7,110,901
- Issue date Sep 19, 2006
- ARKRAY, Inc.
- Atsusi Wada
- G01 - MEASURING TESTING
Information Patent Grant
Test piece analyzing apparatus
- Patent number 6,455,865
- Issue date Sep 24, 2002
- Kyoto Daiichi Kagaku Co., Ltd.
- Kouji Egawa
- G01 - MEASURING TESTING
Information Patent Grant
Test piece analyzing apparatus having an excessive portion removal
- Patent number 6,337,490
- Issue date Jan 8, 2002
- Kyoto Daiichi Kagaku Co., Ltd.
- Noriaki Furusato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Container for Nucleic Acid Extraction, Method of Cleaning Solid Mat...
- Publication number 20080014610
- Publication date Jan 17, 2008
- Arkray,Inc.
- Tatsuo Kamata
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Measuring method and instrument comprising image sensor
- Publication number 20040076325
- Publication date Apr 22, 2004
- Atsusi Wada
- G01 - MEASURING TESTING
Information Patent Application
Correction method for sensor output
- Publication number 20040034494
- Publication date Feb 19, 2004
- Atsusi Wada
- G01 - MEASURING TESTING
Information Patent Application
Test piece analyzing apparatus
- Publication number 20010022348
- Publication date Sep 20, 2001
- KYOTO DAIICHI KAGAKU CO., LTD.
- Noriaki Furusato
- G01 - MEASURING TESTING