Kouji Handa

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Osaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Configuration measuring apparatus and method
- Patent number 6,934,036
- Issue date Aug 23, 2005
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring flatness of thin plate
- Patent number 6,710,883
- Issue date Mar 23, 2004
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Yoshizumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Configuration measuring apparatus and method
- Publication number 20020196449
- Publication date Dec 26, 2002
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring flatness of thin plate
- Publication number 20020167674
- Publication date Nov 14, 2002
- Keiichi Yoshizumi
- G01 - MEASURING TESTING