Kouji Hirayama

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device for analyzing a sample
- Patent number 6,991,762
- Issue date Jan 31, 2006
- ARKRAY, Inc.
- Michio Naka
- G01 - MEASURING TESTING
Information Patent Grant
Suction generating device and sample analysis apparatus using the same
- Patent number 6,325,975
- Issue date Dec 4, 2001
- ARKRAY, Inc.
- Michio Naka
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Test apparatus for assaying a component in a liquid sample
- Patent number 6,299,838
- Issue date Oct 9, 2001
- Kyoto Daiichi Kagaku Co., Ltd.
- Kouji Hirayama
- G01 - MEASURING TESTING
Information Patent Grant
Device for analyzing a sample
- Patent number 6,180,062
- Issue date Jan 30, 2001
- Kyoto Daiichi Kagaku Co., Ltd.
- Michio Naka
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device for analyzing a sample
- Patent number 6,001,307
- Issue date Dec 14, 1999
- Kyoto Daiichi Kagaku Co., Ltd.
- Michio Naka
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
Device and method for analyizing a sample
- Publication number 20060018790
- Publication date Jan 26, 2006
- ARKRAY, INC.
- Michio Naka
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Test apparatus for assaying a component in a liquid sample
- Publication number 20020009387
- Publication date Jan 24, 2002
- KYOTO DAIICHI KAGAKU CO., LTD.
- Kouji Hirayama
- G01 - MEASURING TESTING