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KOUJI ISHIGURO

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Patents Grantslast 30 patents

  • Information Patent Grant

    Component analyzer
    • Patent number D708530
    • Issue date Jul 8, 2014
    • Hitachi High-Technologies Corporation
    • Hiroyuki Noda
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,669,518
    • Issue date Mar 11, 2014
    • Hitachi High-Technologies Corporation
    • Kouji Ishiguro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle radiation device
    • Patent number 8,629,410
    • Issue date Jan 14, 2014
    • Hitachi High-Technologies Corporation
    • Hiroshi Tsuji
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Charged particle beam device
    • Patent number 8,558,193
    • Issue date Oct 15, 2013
    • Hitachi High-Technologies Corporation
    • Shusaku Maeda
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CHARGED PARTICLE BEAM DEVICE
    • Publication number 20120112068
    • Publication date May 10, 2012
    • Shusaku Maeda
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHARGED PARTICLE RADIATION DEVICE
    • Publication number 20120091362
    • Publication date Apr 19, 2012
    • Hitachi High-Technologies Corporation
    • Hiroshi Tsuji
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20110315869
    • Publication date Dec 29, 2011
    • Hitachi High-Technologies Corporation
    • KOUJI ISHIGURO
    • H01 - BASIC ELECTRIC ELEMENTS