Kouji Katahira

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Kikuchi-gun, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card for maintaining the position of a probe in high temperat...
- Patent number 5,670,889
- Issue date Sep 23, 1997
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING