Kouji Kimura

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 6,894,277
- Issue date May 17, 2005
- Kabushiki Kaisha Topcon
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope system
- Patent number 6,717,144
- Issue date Apr 6, 2004
- Kabushiki Kaisha Topcon
- Kouji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,642,520
- Issue date Nov 4, 2003
- Kabushiki Kaisha Topcon
- Kouji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Level converter circuit converting input level into ECL-level again...
- Patent number 5,869,994
- Issue date Feb 9, 1999
- NEC Corporation
- Kouji Kimura
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Scanning electron microscope
- Publication number 20040011959
- Publication date Jan 22, 2004
- KABUSHIKI KAISHA TOPCON
- Hirotami Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope system
- Publication number 20030102430
- Publication date Jun 5, 2003
- Kouji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20020185599
- Publication date Dec 12, 2002
- Kabushiki Kaisha TOPCON
- Kouji Kimura
- H01 - BASIC ELECTRIC ELEMENTS