Kouji Miyatake

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detection apparatus and sample analysis apparatus
- Patent number 12,105,229
- Issue date Oct 1, 2024
- Jeol Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Grant
Silicon drift X-ray detector
- Patent number 8,648,313
- Issue date Feb 11, 2014
- Jeol Ltd.
- Toshiyoshi Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Radiation Detection Apparatus and Sample Analysis Apparatus
- Publication number 20230112252
- Publication date Apr 13, 2023
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Application
Silicon Drift X-Ray Detector
- Publication number 20100163742
- Publication date Jul 1, 2010
- JEOL Ltd.
- Toshiyoshi WATANABE
- G01 - MEASURING TESTING