KOUJI MIYAUCHI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 12,130,324
- Issue date Oct 29, 2024
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 11,800,619
- Issue date Oct 24, 2023
- Advantest Corporation
- Kotaro Hasegawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 11,788,885
- Issue date Oct 17, 2023
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for determining pass or fail of LEDs, test method an...
- Patent number 11,293,966
- Issue date Apr 5, 2022
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Phase locked loop circuit that locks the oscillation frequency to a...
- Patent number 7,907,017
- Issue date Mar 15, 2011
- Advantest Corporation
- Hideki Shirasu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test system and daughter unit
- Patent number 7,688,077
- Issue date Mar 30, 2010
- Advantest Corporation
- Kouji Miyauchi
- G01 - MEASURING TESTING
Information Patent Grant
Frequency conversion sweep measuring method
- Patent number 6,861,833
- Issue date Mar 1, 2005
- Advantest Corporation
- Kouji Miyauchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer
- Patent number 6,316,928
- Issue date Nov 13, 2001
- Advantest Corp.
- Kouji Miyauchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220276090
- Publication date Sep 1, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220232685
- Publication date Jul 21, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220221504
- Publication date Jul 14, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD AND COMPUTER-READABLE MEDIUM
- Publication number 20200379029
- Publication date Dec 3, 2020
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND DAUGHTER UNIT
- Publication number 20090051366
- Publication date Feb 26, 2009
- Advantest Corporation
- KOUJI MIYAUCHI
- G01 - MEASURING TESTING
Information Patent Application
Signal Processing Apparatus
- Publication number 20090004985
- Publication date Jan 1, 2009
- Advantest Corporation
- Hideki Shirasu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASUREMENT DEVICE, METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20080054880
- Publication date Mar 6, 2008
- Advantest Corporation
- Kouji MIYAUCHI
- G01 - MEASURING TESTING
Information Patent Application
Frequency conversion sweep measuring method
- Publication number 20040041554
- Publication date Mar 4, 2004
- Kouji Miyauchi
- G01 - MEASURING TESTING

KOUJI MIYAUCHI

Person

Patents Grantslast 30 patents

Test apparatus, test method, and computer-readable storage medium

Test apparatus, test method, and computer-readable storage medium

Test apparatus, test method, and computer-readable storage medium

Test apparatus for determining pass or fail of LEDs, test method an...

Phase locked loop circuit that locks the oscillation frequency to a...

Test system and daughter unit

Frequency conversion sweep measuring method

Spectrum analyzer

Patents Applicationslast 30 patents

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD AND COMPUTER-READABLE MEDIUM

TEST SYSTEM AND DAUGHTER UNIT

Signal Processing Apparatus

MEASUREMENT DEVICE, METHOD, PROGRAM, AND RECORDING MEDIUM

Frequency conversion sweep measuring method