Kouji Ogawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Reproducing apparatus, reproducing method, information generation a...
- Patent number 10,930,317
- Issue date Feb 23, 2021
- Sony Corporation
- Kouji Ogawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Information processing apparatus and information processing method
- Patent number 10,931,985
- Issue date Feb 23, 2021
- Sony Corporation
- Mitsuhiro Hirabayashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Information processing device, imaging apparatus, image reproductio...
- Patent number 10,878,545
- Issue date Dec 29, 2020
- Sony Corporation
- Kouji Ogawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing device and information processing method
- Patent number 10,845,942
- Issue date Nov 24, 2020
- Sony Corporation
- Hirofumi Shimada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low-vacuum scanning electron microscope
- Patent number 6,686,590
- Issue date Feb 3, 2004
- Jeol Ltd.
- Kouji Ogawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
- Publication number 20190394502
- Publication date Dec 26, 2019
- SONY CORPORATION
- MITSUHIRO HIRABAYASHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...
- Publication number 20190179511
- Publication date Jun 13, 2019
- SONY CORPORATION
- Hirofumi SHIMADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REPRODUCING APPARATUS, REPRODUCING METHOD, INFORMATION GENERATION A...
- Publication number 20190139574
- Publication date May 9, 2019
- SONY CORPORATION
- Kouji OGAWA
- G11 - INFORMATION STORAGE
Information Patent Application
INFORMATION PROCESSING DEVICE, IMAGING APPARATUS, IMAGE REPRODUCTIO...
- Publication number 20190057496
- Publication date Feb 21, 2019
- SONY CORPORATION
- Kouji OGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Low-vacuum scanning electron microscope
- Publication number 20020166966
- Publication date Nov 14, 2002
- JEOL Ltd.
- Kouji Ogawa
- G01 - MEASURING TESTING