Kouji Saitoh

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing integrated circuit using an A/D converter built in a semico...
- Patent number 5,436,558
- Issue date Jul 25, 1995
- Kabushiki Kaisha Toshiba
- Kouji Saitoh
- G01 - MEASURING TESTING
Information Patent Grant
Testing integrated circuit using an A/D converter built in a semico...
- Patent number 5,184,162
- Issue date Feb 2, 1993
- Kabushiki Kaisha Toshiba
- Kouji Saitoh
- G01 - MEASURING TESTING