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Kouji Shizen
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Osaka, JP
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last 30 patents
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Patent Grant
Layered film fabrication method, layered film defect detection meth...
Patent number
7,850,801
Issue date
Dec 14, 2010
Nitto Denko Corporation
Takamasa Kobayashi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
LAYERED FILM FABRICATION METHOD, LAYERED FILM DEFECT DETECTION METH...
Publication number
20090288754
Publication date
Nov 26, 2009
NITTO DENKO CORPORATION
Takamasa Kobayashi
G01 - MEASURING TESTING