Kouji Uesaka

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 11,468,026
- Issue date Oct 11, 2022
- Fujitsu Limited
- Kouji Uesaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Displacement measurement device, displacement measurement method, a...
- Patent number 8,941,841
- Issue date Jan 27, 2015
- Fujitsu Limited
- Katsuki Shirai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing circuit, semiconductor testing jig, semicondu...
- Patent number 8,736,295
- Issue date May 27, 2014
- Fujitsu Limited
- Yuichi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Test system for circuits
- Patent number 7,096,396
- Issue date Aug 22, 2006
- Fujitsu Limited
- Kouji Uesaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20200265029
- Publication date Aug 20, 2020
- Fujitsu Limited
- Kouji Uesaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLACEMENT MEASUREMENT DEVICE, DISPLACEMENT MEASUREMENT METHOD, A...
- Publication number 20130271773
- Publication date Oct 17, 2013
- Fujitsu Limited
- Katsuki Shirai
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING CIRCUIT, SEMICONDUCTOR TESTING JIG, SEMICONDU...
- Publication number 20110057681
- Publication date Mar 10, 2011
- Fujitsu Limited
- Yuichi Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Test system for circuits
- Publication number 20030233208
- Publication date Dec 18, 2003
- FUJITSU LIMITED
- Kouji Uesaka
- G01 - MEASURING TESTING