Kouki Okawauchi

Follow

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus using scanning electron microscope
- Patent number 6,953,939
- Issue date Oct 11, 2005
- Sony Corporation
- Tetsuo Abe
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 6,524,871
- Issue date Feb 25, 2003
- Sony Corporation
- Kouki Okawauchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 6,337,488
- Issue date Jan 8, 2002
- Sony Corporation
- Kouki Okawauchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection device using scanning electron microscope
- Publication number 20040144928
- Publication date Jul 29, 2004
- Tetsuo Abe
- G01 - MEASURING TESTING
Information Patent Application
Defect inspection apparatus and defect inspection method
- Publication number 20020105636
- Publication date Aug 8, 2002
- Kouki Okawauchi
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspecting apparatus, pattern inspecting method, aligner, a...
- Publication number 20020067490
- Publication date Jun 6, 2002
- Kouki Okawauchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY