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Koushik RAGAVAN
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Chennai, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Predictive modeling of metrology in semiconductor processes
Patent number
11,187,992
Issue date
Nov 30, 2021
Applied Materials, Inc.
Raman K. Nurani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data management and mining to correlate wafer alignment, design, de...
Patent number
11,088,039
Issue date
Aug 10, 2021
Applied Materials, Inc.
Raman K. Nurani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of predicting areas of vulnerable yield in a semiconductor s...
Patent number
10,614,262
Issue date
Apr 7, 2020
Applied Materials, Inc.
Raman K. Nurani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor process control method
Patent number
10,579,041
Issue date
Mar 3, 2020
Applied Materials, Inc.
Raman K. Nurani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Using design proximity index and effect-to-design proximity ratio t...
Patent number
10,579,769
Issue date
Mar 3, 2020
Applied Materials, Inc.
Raman K. Nurani
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF PREDICTING AREAS OF VULNERABLE YIELD IN A SEMICONDUCTOR S...
Publication number
20190171786
Publication date
Jun 6, 2019
APPLIED MATERIALS, INC.
Raman K. NURANI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR PROCESS CONTROL METHOD
Publication number
20190171181
Publication date
Jun 6, 2019
Applied Materials, Inc.
Raman K. NURANI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DATA MANAGEMENT AND MINING TO CORRELATE WAFER ALIGNMENT, DESIGN, DE...
Publication number
20190122944
Publication date
Apr 25, 2019
Applied Materials, Inc.
Raman K. NURANI
G05 - CONTROLLING REGULATING
Information
Patent Application
PREDICTIVE MODELING OF METROLOGY IN SEMICONDUCTOR PROCESSES
Publication number
20190121237
Publication date
Apr 25, 2019
Applied Materials, Inc.
Raman K. NURANI
H01 - BASIC ELECTRIC ELEMENTS